Instrument Systems UV Integrating Spheres
Highly Reflective PTFE Coating
Instrument Systems offer a wide range integrating spheres made of PTFE material and complete UV portfolio measurements systems for UV radiation in the ranges UV-A, UV-B and UV-C. A combination with high-quality spectroradiometers of the CAS series enable ultrasensitive measurements of UV radiant power down to 200 nm.
Each sphere is equipped with a set of measurement adapters for all relevant applications in the lab and in UV-LED production. The highly reflective PTFE coating ensures high throughput, also in the critical ranges UV-C and UV-B.
All UV measuring systems with PTFE integrating spheres are delivered with calibration traceable to PTB.
Precise Radiometric Characterization down to 200nm
Typical production applications for small ISP-UV spheres are, e.g. wafer probing and chip testing, for larger spheres single-/multi-chip testing.
PTFE spheres are used in the lab both in actual product development of UV-LEDs and for building reference systems for the production of UV light sources. Contact us for more information
APPLICATIONS
UV-LEDs
ISP50-UV
ISP100-UV
ISP150-UV
ISP250-UV
ISP50-UV Integrating Sphere
| Model | ISP50-UV |
| Inner Diameter | 50mm |
| Usable Wavelength | 200 ~ 2500nm |
| Application | Wafer probing, chip testing etc. in production and laboratory |
Specification is subject to change without prior notice.
ISP100-UV Integrating Sphere
| Model | ISP100-UV |
| Inner Diameter | 100mm |
| Usable Wavelength | 200 ~ 2500nm |
| Application | Wafer probing, chip testing etc. in production and laboratory |
Specification is subject to change without prior notice.
ISP150-UV Integrating Sphere
| Model | ISP150-UV |
| Inner Diameter | 150mm |
| Usable Wavelength | 200 ~ 2500nm |
| Application | Single / Multi die or chip testing in laboratory and production etc. |
Specification is subject to change without prior notice.
Integrating Sphere ISP250-UV
| Model | ISP250-UV |
| Inner Diameter | 250mm |
| Usable Wavelength | 200 ~ 2500nm |
| Application | Multi-die and chip testing in laboratory and production etc. |
Specification is subject to change without prior notice.
